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IEC 61032 Test Probe B

    Buy cheap IEC 61032 Test Probe B from wholesalers
     
    Buy cheap IEC 61032 Test Probe B from wholesalers
    • Buy cheap IEC 61032 Test Probe B from wholesalers
    • Buy cheap IEC 61032 Test Probe B from wholesalers
    • Buy cheap IEC 61032 Test Probe B from wholesalers
    • Buy cheap IEC 61032 Test Probe B from wholesalers

    IEC 61032 Test Probe B

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    Brand Name : HeJin
    Model Number : HT-I02
    Certification : calibration certificate (cost additional)
    Price : Negotiatable
    Payment Terms : L/C, T/T
    Supply Ability : 30 sets / per month
    Delivery Time : 3 days
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    IEC 61032 Test Probe B

    IEC61032 Test Finger Probe Figure 2 Test Probe B 80mm Finger Length


    Standard:

    IEC 61032 ‘Protection of persons and equipment by enclosures – Probes for verification’ figure 2 test probe B.

    IEC 60529 Degrees of protection provided by enclosures (IP Code) IP2X

    IEC 60335-1 ‘Household and similar electrical appliances – Safety – Part 1: General requirements’


    Application:

    This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

    Access probes of IEC 60529 (IP code) to verify protection of persons against access to hazardous live parts or hazardous mechanical parts.


    Feature:

    It has two movable joints, which can be curved at 90°. Can be used with a electrical indicator.

    A hole (M6) can be made at the end of the handle for connection with a push-pull gauge. The model with ‘T’ means that this model is with force.


    Parameter:

    ModelHT-I02HT-I02AHT-I02BHT-I02T
    Name

    Standard Test Finger

    Test Finger Probe

    Circular Baffle Test fingerLarge Baffle Test FingerStandard Test Finger With Force
    Joint 130±0.230±0.230±0.230±0.2
    Joint 260±0.260±0.260±0.260±0.2
    Finger length80±0.280±0.2100±0.280±0.2
    Fingertip to baffle180±0.2180±0.2----180±0.2
    CylindricalR2±0.05R2±0.05R2±0.05R2±0.05
    SphericalR4±0.05R4±0.05R4±0.05R4±0.05
    Fingertip cutting bevel angle37o 0 -10′37o 0 -10′37o 0 -10′37o 0 -10′
    Fingertip taper14 o 0 -10′14 o 0 -10′14 o 0 -10′14 o 0 -10′
    Test finger diameterФ12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05
    A-A Section diameterФ50Ф50----Ф50
    A-A Section width20±0.2--------20±0.2
    Baffle diameterФ75±0.2Ф75±0.2Ф125±0.2Ф75±0.2
    Baffle thickness5±0.55±0.5----5±0.5
    Force------------With force 0-50N
    Applied standardIEC61032-1IEC60335-1IEC60335-2-14IEC60529-1

    IEC 61032 Test Probe B IEC 61032 Test Probe B

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